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VAM Bulletin - Autumn 2006

19/10/2006 Issue 35

In this issue

Guest column

  • The ongoing revolution

Focus on mass spectrometry

  • Analysis of organic and inorganic surfaces using cluster SIMS
  • High accuracy analysis using mass spectrometry
  • TOF-SIMS: Accurate calibration of the mass scale

Contributed articles

  • New approach on internal quality control from Nordtest/NICe
  • Gravimetry of ambient air monitoring filters
  • Improving the reproducibility of surface enhanced Raman spectroscopy (SERS)
  • Chemistry Innovation KTN and �Analytical and Measurement Sciences�

Reference materials

  • How confident are you in your references?
  • Pure certified reference materials

Chemical nomenclature

  • Adapting the SI to the 21st century

Statistics

  • Numerical error estimation: its application to the evaluation of a combined uncertainty

Education and training

  • Promoting the teaching of chemical metrology to undergraduates
  • Introduction to achieving reliable measurements
  • New best practice guide on generating mass spectra

Forthcoming events

  • Nano-molecular analysis for emerging technologies II
  • Estimation of sampling uncertainty: Planning, evaluating, improving
  • LGC�s analytical training programme

Contact points

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