VAM Bulletin - Autumn 2006
19/10/2006 Issue 35
In this issue
Guest column
Focus on mass spectrometry
- Analysis of organic and inorganic surfaces using cluster SIMS
- High accuracy analysis using mass spectrometry
- TOF-SIMS: Accurate calibration of the mass scale
Contributed articles
- New approach on internal quality control from Nordtest/NICe
- Gravimetry of ambient air monitoring filters
- Improving the reproducibility of surface enhanced Raman spectroscopy (SERS)
- Chemistry Innovation KTN and �Analytical and Measurement Sciences�
Reference materials
- How confident are you in your references?
- Pure certified reference materials
Chemical nomenclature
- Adapting the SI to the 21st century
Statistics
- Numerical error estimation: its application to the evaluation of a combined uncertainty
Education and training
- Promoting the teaching of chemical metrology to undergraduates
- Introduction to achieving reliable measurements
- New best practice guide on generating mass spectra
Forthcoming events
- Nano-molecular analysis for emerging technologies II
- Estimation of sampling uncertainty: Planning, evaluating, improving
- LGC�s analytical training programme
Contact points
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